Numerical comparison of grid pattern diffraction effects through measurement and modeling with OptiScan software

Ian B. Murray, Victor Densmore, Vaibhav Bora, Matthew W. Pieratt, Douglas L. Hibbard, Tom D. Milster

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Scopus citations


Coatings of various metalized patterns are used for heating and electromagnetic interference (EMI) shielding applications. Previous work has focused on macro differences between different types of grids, and has shown good correlation between measurements and analyses of grid diffraction. To advance this work, we have utilized the University of Arizona's OptiScan software, which has been optimized for this application by using the Babinet Principle. When operating on an appropriate computer system, this algorithm produces results hundreds of times faster than standard Fourier-based methods, and allows realistic cases to be modeled for the first time. By using previously published derivations by Exotic Electro-Optics, we compare diffraction performance of repeating and randomized grid patterns with equivalent sheet resistance using numerical performance metrics. Grid patterns of each type are printed on optical substrates and measured energy is compared against modeled energy.

Original languageEnglish (US)
Title of host publicationWindow and Dome Technologies and Materials XII
StatePublished - 2011
EventWindow and Dome Technologies and Materials XII - Orlando, FL, United States
Duration: Apr 27 2011Apr 28 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


OtherWindow and Dome Technologies and Materials XII
Country/TerritoryUnited States
CityOrlando, FL


  • Babinet
  • OptiScan
  • diffraction
  • grid
  • hub and spoke
  • mesh
  • sheet resistance
  • shielding effectiveness

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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