Noncontact force microscopy in liquids

R. Giles; J. P. Cleveland; S. Manne; P. K. Hansma; B. Drake; P. Maivald; C. Boles; J. Gurley; V. Elings

doi:10.1063/1.109967

Noncontact force microscopy in liquids

R. Giles, J. P. Cleveland, S. Manne, P. K. Hansma, B. Drake, P. Maivald, C. Boles, J. Gurley, V. Elings

Research output: Contribution to journal › Article › peer-review

58 Scopus citations

Abstract

Force microscopy in liquids offers many advantages including the mitigation of capillary forces and the simulation of real environments for biological and technological processes. Noncontact force microscopy in liquids adds the advantage of probing electrical and magnetic fields above surfaces. Here we demonstrate magnetic force imaging of recorded bits on a computer hard disk in air and in liquid. A method of noncontact force microscopy (patent pending, Digital Instruments) is used in which the tip is first scanned in contact to image topography and then rescanned above the surface to image long-range forces.

Original language	English (US)
Pages (from-to)	617-618
Number of pages	2
Journal	Applied Physics Letters
Volume	63
Issue number	5
DOIs	https://doi.org/10.1063/1.109967
State	Published - 1993
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.109967

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@article{d6e342b126d34803b93ee44a9b551ab1,

title = "Noncontact force microscopy in liquids",

abstract = "Force microscopy in liquids offers many advantages including the mitigation of capillary forces and the simulation of real environments for biological and technological processes. Noncontact force microscopy in liquids adds the advantage of probing electrical and magnetic fields above surfaces. Here we demonstrate magnetic force imaging of recorded bits on a computer hard disk in air and in liquid. A method of noncontact force microscopy (patent pending, Digital Instruments) is used in which the tip is first scanned in contact to image topography and then rescanned above the surface to image long-range forces.",

author = "R. Giles and Cleveland, {J. P.} and S. Manne and Hansma, {P. K.} and B. Drake and P. Maivald and C. Boles and J. Gurley and V. Elings",

year = "1993",

doi = "10.1063/1.109967",

language = "English (US)",

volume = "63",

pages = "617--618",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "5",

}

TY - JOUR

T1 - Noncontact force microscopy in liquids

AU - Giles, R.

AU - Cleveland, J. P.

AU - Manne, S.

AU - Hansma, P. K.

AU - Drake, B.

AU - Maivald, P.

AU - Boles, C.

AU - Gurley, J.

AU - Elings, V.

PY - 1993

Y1 - 1993

N2 - Force microscopy in liquids offers many advantages including the mitigation of capillary forces and the simulation of real environments for biological and technological processes. Noncontact force microscopy in liquids adds the advantage of probing electrical and magnetic fields above surfaces. Here we demonstrate magnetic force imaging of recorded bits on a computer hard disk in air and in liquid. A method of noncontact force microscopy (patent pending, Digital Instruments) is used in which the tip is first scanned in contact to image topography and then rescanned above the surface to image long-range forces.

AB - Force microscopy in liquids offers many advantages including the mitigation of capillary forces and the simulation of real environments for biological and technological processes. Noncontact force microscopy in liquids adds the advantage of probing electrical and magnetic fields above surfaces. Here we demonstrate magnetic force imaging of recorded bits on a computer hard disk in air and in liquid. A method of noncontact force microscopy (patent pending, Digital Instruments) is used in which the tip is first scanned in contact to image topography and then rescanned above the surface to image long-range forces.

UR - http://www.scopus.com/inward/record.url?scp=0011234220&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0011234220&partnerID=8YFLogxK

U2 - 10.1063/1.109967

DO - 10.1063/1.109967

M3 - Article

AN - SCOPUS:0011234220

SN - 0003-6951

VL - 63

SP - 617

EP - 618

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 5

ER -

Noncontact force microscopy in liquids

Abstract

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