Non-planar illumination deflectometry for axicon metrology

Henry Quach, Hyukmo Kang, Byeongjoon Jeong, Heejoo Choi, Daewook Kim

Research output: Contribution to journalArticlepeer-review

1 Scopus citations


We introduce an on-axis deflectometry test configuration for axicon metrology. Axicons are challenging to measure due to their characteristically steep, convex geometry. However, if an axicon is coaxially aligned with a camera and a surrounding cylindrical illumination source, high-resolution surface measurements can be obtained via the principle of deflectometry. Emitted from the temporally modulated source, light deflects at the conical surface and into the entrance pupil of a camera, illuminating the full axicon aperture except the ø 0.5-mm rounded tip. Deflectometry measurements of a 100° and 140° axicon show holistic cone angle agreement within 0.035° against touch probe data and up to 7.93 root µm mean square difference from a best-fit cone. We discuss the non-planar illumination architecture, sensitivity, and experimental results of arbitrary apex angle axicons.

Original languageEnglish (US)
Pages (from-to)3636-3639
Number of pages4
JournalOptics letters
Issue number15
StatePublished - Aug 1 2022

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics


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