Nickel oxide interlayer films from nickel formate-ethylenediamine precursor: Influence of annealing on thin film properties and photovoltaic device performance

K. X. Steirer, R. E. Richards, A. K. Sigdel, A. Garcia, P. F. Ndione, S. Hammond, D. Baker, E. L. Ratcliff, C. Curtis, T. Furtak, D. S. Ginley, D. C. Olson, N. R. Armstrong, J. J. Berry

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Engineering & Materials Science

Chemical Compounds