Near-Field Integration of a Si3N4 Nanobeam and a SiO2 Microcavity for Heisenberg-Limited Displacement Sensing

  • R. Schilling
  • , H. Schütz
  • , A. Ghadimi
  • , V. Sudhir
  • , D. J. Wilson
  • , T. J. Kippenberg

Research output: Contribution to journal › Conference article › peer-review

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Material Science