Near-Field Integration of a Si3N4 Nanobeam and a SiO2 Microcavity for Heisenberg-Limited Displacement Sensing

R. Schilling, H. Schütz, A. Ghadimi, V. Sudhir, D. J. Wilson, T. J. Kippenberg

Research output: Contribution to journalConference articlepeer-review

Abstract

A single-chip radio-frequency optomechanical system, consisting of a Si3N4 nanobeam in the evanescent near-field of a SiO2 optical microdisk resonator realizes displacement imprecision >30dB below the standard quantum limit at room-temperature.

Original languageEnglish (US)
Article numberSTu1H.1
JournalOptics InfoBase Conference Papers
StatePublished - 2016
Externally publishedYes
EventCLEO: Science and Innovations, SI 2016 - San Jose, United States
Duration: Jun 5 2016Jun 10 2016

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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