Near-field integration of a Si3N4 nanobeam and a SiO2 microcavity for heisenberg-limited displacement sensing

R. Schilling, H. Schutz, A. Ghadimi, V. Sudhir, D. J. Wilson, T. J. Kippenberg

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A single-chip radio-frequency optomechanical system, consisting of a Si3N4 nanobeam in the evanescent near-field of a SiO2 optical microdisk resonator realizes displacement imprecision >30dB below the standard quantum limit at room-temperature.

Original languageEnglish (US)
Title of host publication2016 Conference on Lasers and Electro-Optics, CLEO 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580118
DOIs
StatePublished - Dec 16 2016
Externally publishedYes
Event2016 Conference on Lasers and Electro-Optics, CLEO 2016 - San Jose, United States
Duration: Jun 5 2016Jun 10 2016

Publication series

Name2016 Conference on Lasers and Electro-Optics, CLEO 2016

Other

Other2016 Conference on Lasers and Electro-Optics, CLEO 2016
Country/TerritoryUnited States
CitySan Jose
Period6/5/166/10/16

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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