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Near-Field Integration of a SiN Nanobeam and a SiO2 Microcavity for Heisenberg-Limited Displacement Sensing
R. Schilling, H. Schütz, A. H. Ghadimi, V. Sudhir, D. J. Wilson, T. J. Kippenberg
Research output: Contribution to journal › Article › peer-review
52
Scopus
citations