Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination

Maik Scheller; Kai Baaske; Martin Koch

doi:10.1063/1.3402767

Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination

Maik Scheller
, Kai Baaske
, Martin Koch

Research output: Contribution to journal › Article › peer-review

31 Scopus citations

Abstract

We present a tunable multifrequency continuous wave terahertz spectrometer based on two laser diodes, photoconductive antennas, and a coherent detection scheme. The system is employed to determine the absolute thickness of samples utilizing a proposed synthetic difference frequency method to circumvent the 2π uncertainty known from conventional photomixing systems while preserving a high spatial resolution.

Original language	English (US)
Article number	151112
Journal	Applied Physics Letters
Volume	96
Issue number	15
DOIs	https://doi.org/10.1063/1.3402767
State	Published - Apr 12 2010
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.3402767

Cite this

@article{ac6a733564334981b3fa24bbca974610,

title = "Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination",

abstract = "We present a tunable multifrequency continuous wave terahertz spectrometer based on two laser diodes, photoconductive antennas, and a coherent detection scheme. The system is employed to determine the absolute thickness of samples utilizing a proposed synthetic difference frequency method to circumvent the 2π uncertainty known from conventional photomixing systems while preserving a high spatial resolution.",

author = "Maik Scheller and Kai Baaske and Martin Koch",

year = "2010",

month = apr,

day = "12",

doi = "10.1063/1.3402767",

language = "English (US)",

volume = "96",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "15",

}

TY - JOUR

T1 - Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination

AU - Scheller, Maik

AU - Baaske, Kai

AU - Koch, Martin

PY - 2010/4/12

Y1 - 2010/4/12

N2 - We present a tunable multifrequency continuous wave terahertz spectrometer based on two laser diodes, photoconductive antennas, and a coherent detection scheme. The system is employed to determine the absolute thickness of samples utilizing a proposed synthetic difference frequency method to circumvent the 2π uncertainty known from conventional photomixing systems while preserving a high spatial resolution.

AB - We present a tunable multifrequency continuous wave terahertz spectrometer based on two laser diodes, photoconductive antennas, and a coherent detection scheme. The system is employed to determine the absolute thickness of samples utilizing a proposed synthetic difference frequency method to circumvent the 2π uncertainty known from conventional photomixing systems while preserving a high spatial resolution.

UR - https://www.scopus.com/pages/publications/77951611623

UR - https://www.scopus.com/pages/publications/77951611623#tab=citedBy

U2 - 10.1063/1.3402767

DO - 10.1063/1.3402767

M3 - Article

AN - SCOPUS:77951611623

SN - 0003-6951

VL - 96

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 15

M1 - 151112

ER -

Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this