Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination

Maik Scheller; Kai Baaske; Martin Koch

doi:10.1063/1.3402767

Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination

Maik Scheller, Kai Baaske, Martin Koch

Research output: Contribution to journal › Article › peer-review

30 Scopus citations

Abstract

We present a tunable multifrequency continuous wave terahertz spectrometer based on two laser diodes, photoconductive antennas, and a coherent detection scheme. The system is employed to determine the absolute thickness of samples utilizing a proposed synthetic difference frequency method to circumvent the 2π uncertainty known from conventional photomixing systems while preserving a high spatial resolution.

Original language	English (US)
Article number	151112
Journal	Applied Physics Letters
Volume	96
Issue number	15
DOIs	https://doi.org/10.1063/1.3402767
State	Published - Apr 12 2010
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.3402767

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abstract = "We present a tunable multifrequency continuous wave terahertz spectrometer based on two laser diodes, photoconductive antennas, and a coherent detection scheme. The system is employed to determine the absolute thickness of samples utilizing a proposed synthetic difference frequency method to circumvent the 2π uncertainty known from conventional photomixing systems while preserving a high spatial resolution.",

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AB - We present a tunable multifrequency continuous wave terahertz spectrometer based on two laser diodes, photoconductive antennas, and a coherent detection scheme. The system is employed to determine the absolute thickness of samples utilizing a proposed synthetic difference frequency method to circumvent the 2π uncertainty known from conventional photomixing systems while preserving a high spatial resolution.

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Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination

Abstract

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