Multiband imaging photometer for SIRTF: An overview of the verification and validation effort

Thomas S. Glenn, Gerald B. Heim, John Troeltzsch, Bryce W. Unruh, Jeremiah Winghart, J. Doug Bean, George B. Rieke, Doug M. Kelly

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Verification and validation (V&V) of the Multiband Imaging Photometer for SIRTF (MIPS) instrument, one of three science instruments on-board the Space Infrared Telescope Facility (SIRTF), provided a variety of challenges during the various integration and test phases. The MIPS instrument provides imaging in the far infrared optical spectrum, with photometry and total power measurement in spectral bands centered at 24, 70, and 160 /spl mu/m, and low-resolution spectroscopy between 50 and 95 /spl mu/m. A single, one axis scan mirror detects the light to three detectors, a 128/spl times/128 Si:As BIB, 32/spl times/32 Ge:Ga, and 2/spl times/20 stressed Ge:Ga. Our V&V challenges can be categorized into three areas: 1) thermal constraints - focal planes require temperatures in the 1.5 - 2.0K to operate, 2) data processing - analyzing and managing high data volumes, and 3) personnel - staffing a limited budget test and software maintenance effort. This paper presents an overview of the MIPS instrument test program from standalone instrument testing through integration with the spacecraft and integrated observatory level testing. For each testing phase, goals, methodologies, test tools, and lessons learned are presented. Proper test personnel staffing and parallel software development issues are emphasized. In addition, we should look forward to post-launch support and see how to bring the lessons learned in earlier phases forward.

Original languageEnglish (US)
Title of host publication2003 IEEE Aerospace Conference, Proceedings
Number of pages10
StatePublished - 2003
Event2003 IEEE Aerospace Conference - Big Sky, MT, United States
Duration: Mar 8 2003Mar 15 2003

Publication series

NameIEEE Aerospace Conference Proceedings
ISSN (Print)1095-323X


Other2003 IEEE Aerospace Conference
Country/TerritoryUnited States
CityBig Sky, MT

ASJC Scopus subject areas

  • Aerospace Engineering
  • Space and Planetary Science


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