Abstract
The advantage of using high-resolution powder diffraction data to resolve ambiguities in powder diffraction analyses is widely understood. The problem with using such an instrument for routine analyses is the length of time needed to acquire a data set. An obvious solution is to introduce some parallelism in the detector/analyzer system. The system described here uses monolithic elastic design principles to construct a simple 16-element crystal analyzer, and it uses silicon multi-detector technology developed at Brookhaven to provide a compact 16-channel pulse-counting detector system. Together these components can decrease the data collection time by at least a factor of 10. Simple replication of components could further increase the efficiency of collection.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 120-131 |
| Number of pages | 12 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3448 |
| State | Published - 1998 |
| Externally published | Yes |
| Event | Proceedings of the 1998 Conference on Crystal and Multilayer Optics - San Diego, CA, USA Duration: Jul 21 1998 → Jul 22 1998 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering