TY - GEN

T1 - Mueller Polarimetry for Quantifying the Stress Optic Coefficient in the Infrared

AU - Parkinson, Jeremy

AU - Coronato, Patrick

AU - Greivenkamp, Jake

AU - Vukobratovich, Daniel

AU - Kupinski, Meredith

N1 - Publisher Copyright:
© 2023 SPIE.

PY - 2023

Y1 - 2023

N2 - The stress optic coefficient of an infrared transmitting material was measured at room temperature at a wavelength of 1550nm. This work discusses a Mueller matrix imaging experiment to measure the stress optic coefficient, observe the spatial distribution of birefringence, and quantify experimental sources of uncertainty. A one-inch diameter disk of sample material was diametrically loaded with increasing force, and linear retardance was measured in the central region. Finite element and analytical modeling was done to estimate the magnitude of stress in this central region. A Rotating Retarder Mueller Matrix Imaging Polarimeter measured the spatial distribution of linear retardance. The retardance is related to the change in birefringence with stress magnitude. The slope of this linear fit is the stress optic coefficient. The stress optic coefficient of the infrared transmitting material was measured to be 1.89 ± 0.1424 [TPa]−1. To test the precision of our stress optic coefficient measurement procedure, a 1-inch diameter N-BK7 disk was measured at a wavelength of 1550nm and compared with industry-accepted values. The stress optic coefficient of N-BK7 was measured as 2.83 ± 0.1057[TPa]−1. The published N-BK7 value measured at visible wavelengths is 2.77 [TPa]−1 ± 3%.1-3 This agreement validates the experimental Mueller matrix imaging methods and supports the common assumption of minor wavelength dependence of the stress optic coefficient.

AB - The stress optic coefficient of an infrared transmitting material was measured at room temperature at a wavelength of 1550nm. This work discusses a Mueller matrix imaging experiment to measure the stress optic coefficient, observe the spatial distribution of birefringence, and quantify experimental sources of uncertainty. A one-inch diameter disk of sample material was diametrically loaded with increasing force, and linear retardance was measured in the central region. Finite element and analytical modeling was done to estimate the magnitude of stress in this central region. A Rotating Retarder Mueller Matrix Imaging Polarimeter measured the spatial distribution of linear retardance. The retardance is related to the change in birefringence with stress magnitude. The slope of this linear fit is the stress optic coefficient. The stress optic coefficient of the infrared transmitting material was measured to be 1.89 ± 0.1424 [TPa]−1. To test the precision of our stress optic coefficient measurement procedure, a 1-inch diameter N-BK7 disk was measured at a wavelength of 1550nm and compared with industry-accepted values. The stress optic coefficient of N-BK7 was measured as 2.83 ± 0.1057[TPa]−1. The published N-BK7 value measured at visible wavelengths is 2.77 [TPa]−1 ± 3%.1-3 This agreement validates the experimental Mueller matrix imaging methods and supports the common assumption of minor wavelength dependence of the stress optic coefficient.

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U2 - 10.1117/12.2676478

DO - 10.1117/12.2676478

M3 - Conference contribution

AN - SCOPUS:85178521204

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Polarization Science and Remote Sensing XI

A2 - Kupinski, Meredith K.

A2 - Shaw, Joseph A.

A2 - Snik, Frans

PB - SPIE

T2 - Polarization Science and Remote Sensing XI 2023

Y2 - 21 August 2023 through 22 August 2023

ER -