Motivations and methods for the analysis of multi-modality X-ray systems for explosives detection

Joshua H. Carpenter, Yijun Ding, Ava Hurlock, David Coccarelli, Chris Gregory, Souleymane O. Diallo, Amit Ashok, Michael E. Gehm, Joel A. Greenberg

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Transmission-based imaging and X-ray diffraction-based material analysis have largely developed independently. However, for a variety of applications ranging from in-vivo soft tissue analysis to concealed explosives detection, it is necessary to realize high-fidelity, spatially-resolved material discrimination. We therefore seek to understand to what degree transmission and X-ray diffraction (XRD) complement one another and can be implemented practically, particularly in the case of explosives detection in aviation security. Using a combination of simulated and experimental data, we identify the relative value of the X-ray signatures available to transmission and XRD measurements, and explore how the measurement fidelity can impact these results.

Original languageEnglish (US)
Title of host publicationAnomaly Detection and Imaging with X-Rays (ADIX) IV
EditorsAmit Ashok, Joel A. Greenberg, Michael E. Gehm
PublisherSPIE
ISBN (Electronic)9781510626638
DOIs
StatePublished - 2019
EventAnomaly Detection and Imaging with X-Rays (ADIX) IV 2019 - Baltimore, United States
Duration: Apr 15 2019Apr 16 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10999
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceAnomaly Detection and Imaging with X-Rays (ADIX) IV 2019
Country/TerritoryUnited States
CityBaltimore
Period4/15/194/16/19

Keywords

  • Aviation security
  • Material characterization
  • Tomography
  • X-ray diffraction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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