Abstract
In this study, the dependence of the temporal modulation of a Cd1-xZnxTe detector, operated under scanning beam geometry, of both the applied electric field and detector thickness, at each frequency of a scanning square-wave test pattern, have been measured. The experimental arrangement, although is not offered for large field-of-view imaging applications, it offers potential capabilities for feasibility studies, research and evaluation of the temporal response and noise characteristics of a Cd1-xZnxTe detector, for fast digital radiographic and computed tomographic (CT) applications. The experimental results indicate a system spatial resolution of >8 cy/mm. Currently, efforts are made aimed at improving to the imaging potential of the experimental detector system, by optimizing system geometry as well as by increasing the temporal response of the overall system.
| Original language | English (US) |
|---|---|
| Pages | 456-461 |
| Number of pages | 6 |
| State | Published - 1998 |
| Externally published | Yes |
| Event | Proceedings of the 1998 IEEE Instrumentation and Measurement Technology Conference, IMTC. Part 1 (of 2) - St.Paul, MN, USA Duration: May 18 1998 → May 21 1998 |
Other
| Other | Proceedings of the 1998 IEEE Instrumentation and Measurement Technology Conference, IMTC. Part 1 (of 2) |
|---|---|
| City | St.Paul, MN, USA |
| Period | 5/18/98 → 5/21/98 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering