TY - JOUR
T1 - Modification of BaTiO3 thin films
T2 - Adjustment of the effective surface work function
AU - Schulmeyer, T.
AU - Paniagua, S. A.
AU - Veneman, P. A.
AU - Jones, S. C.
AU - Hotchkiss, P. J.
AU - Mudalige, A.
AU - Pemberton, J. E.
AU - Marder, S. R.
AU - Armstrong, N. R.
PY - 2007/10/30
Y1 - 2007/10/30
N2 - Sputter-deposited BaTiO3 thin films have been modified with an alkylphosphonic acid and a partially-fluorinated alkylphosphonic acid in order to model the surface composition of similarly modified BaTiO3 nanoparticles. We present here the surface characterization of these modified films by a combination of X-ray photoelectron spectroscopy (XPS) and UV-photoelectron spectroscopy (UPS). BaTiO3 layers of average thicknesses ca. 2 nm were prepared by radio frequency (rf) magnetron sputter deposition on Ag films, to avoid charging effects during XPS/UPS characterization. Octadecylphosphonic acid (ODPA) and 3,3,4,4,5,5,6,6,7,7,8,8,8-tridecafluorooctyl phosphonic acid (perfluorohexyloctyl phosphonic acid, FHOPA), molecules with quite different molecular dipole moments, were chemisorbed from solution to the BaTiO3 surface. Polarization-modulation infrared reflection-absorption spectroscopy (PM-IRRAS) of the modified BaTiO3 films indicated bidentate bonding of the alkylphosphonic acid to the oxide. Modification of the BaTiO3 surface with the partially-fluorinated alkylphosphonic acid (versus the normal alkylphosphonic acid) significantly changes the BaTiO3 interface dipole as revealed by UPS/XPS measurements, which, in turn, changes the frontier orbital offsets between the oxide and the organic modifier.
AB - Sputter-deposited BaTiO3 thin films have been modified with an alkylphosphonic acid and a partially-fluorinated alkylphosphonic acid in order to model the surface composition of similarly modified BaTiO3 nanoparticles. We present here the surface characterization of these modified films by a combination of X-ray photoelectron spectroscopy (XPS) and UV-photoelectron spectroscopy (UPS). BaTiO3 layers of average thicknesses ca. 2 nm were prepared by radio frequency (rf) magnetron sputter deposition on Ag films, to avoid charging effects during XPS/UPS characterization. Octadecylphosphonic acid (ODPA) and 3,3,4,4,5,5,6,6,7,7,8,8,8-tridecafluorooctyl phosphonic acid (perfluorohexyloctyl phosphonic acid, FHOPA), molecules with quite different molecular dipole moments, were chemisorbed from solution to the BaTiO3 surface. Polarization-modulation infrared reflection-absorption spectroscopy (PM-IRRAS) of the modified BaTiO3 films indicated bidentate bonding of the alkylphosphonic acid to the oxide. Modification of the BaTiO3 surface with the partially-fluorinated alkylphosphonic acid (versus the normal alkylphosphonic acid) significantly changes the BaTiO3 interface dipole as revealed by UPS/XPS measurements, which, in turn, changes the frontier orbital offsets between the oxide and the organic modifier.
UR - https://www.scopus.com/pages/publications/35648990487
UR - https://www.scopus.com/pages/publications/35648990487#tab=citedBy
U2 - 10.1039/b706949a
DO - 10.1039/b706949a
M3 - Article
AN - SCOPUS:35648990487
SN - 0959-9428
VL - 17
SP - 4563
EP - 4570
JO - Journal of Materials Chemistry
JF - Journal of Materials Chemistry
IS - 43
ER -