@inproceedings{26643cc5ae724105820573b17f94f27c,
title = "Modification and upgrade of AzRISE/TEP solar photovoltaic test yard",
abstract = "The University of Arizona AzRISE (Arizona Research Institute for Solar Energy) and Tucson Electric Power solar test yard is currently undergoing renovations to upgrade and standardize the data acquisition capabilities throughout the yard. Test yard improvements have enabled increased data collection reliability through state-of-The-Art and environmentallyrobust data logging and real-Time analysis. Enhanced capabilities include 10 msec max. data resolution, precision PV backside temperature monitoring of both individual and strings of modules, measurement of both AC and DC outputs as well as GHI and POA irradiance, active data backup to eliminate data intermittency, and robust Ethernet connectivity for data collection. An on-site weather station, provides wind speed and direction, relative humidity, and air temperature data. The information collected is accessed remotely via web server and includes raw performance and environmental conditions as well as extracted figures of performance for systems under test. Complementing the UA's existing accelerated environmental-Testing chamber, the new test yard acquisition capabilities have enabled high fidelity system and sub-system-level operational testing under a range of field-level test conditions. The combined facilities, thus, provide a full-spectrum testing resource for photovoltaic performance and degradation analysis. Specific measurement characteristics and sample data collected from a polysilicon module test string are utilized to illustrate test yard capabilities.",
keywords = "Data Logger, Environmental Degradation, Lifecycle Test, Photovoltaic, Reliability, Solar, Test Yard",
author = "Whit Bennett and Asher Fishgold and Teh Lai and Teri Elwood and Potter, {Barrett G.} and Kelly Simmons-Potter",
note = "Publisher Copyright: {\textcopyright} 2016 SPIE.; Reliability of Photovoltaic Cells, Modules, Components, and Systems IX ; Conference date: 28-08-2016 Through 29-08-2016",
year = "2016",
doi = "10.1117/12.2238187",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Dhere, {Neelkanth G.} and Wohlgemuth, {John H.} and Keiichiro Sakurai",
booktitle = "Reliability of Photovoltaic Cells, Modules, Components, and Systems IX",
}