Abstract
Complex absorption spectra obtained from thin films at normal incidence can be difficult to interpret owing to the appearance of Fabry-Perot interference fringes in the data. We describe a technique for modeling such spectra so that true absorption features can be identified and evaluated separately from the overlying fringes. The technique is used to interpret data obtained from photosensitive germanosilicate solgel films on fused-silica substrates but may be easily extended to analysis in other material systems.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 268-272 |
| Number of pages | 5 |
| Journal | Journal of the Optical Society of America B: Optical Physics |
| Volume | 13 |
| Issue number | 2 |
| DOIs | |
| State | Published - Feb 1996 |
| Externally published | Yes |
ASJC Scopus subject areas
- Statistical and Nonlinear Physics
- Atomic and Molecular Physics, and Optics