TY - GEN
T1 - Modeling an interferometer for non-null testing of aspheres
AU - Lowman, Andrew E.
AU - Greivenkamp, John E.
PY - 1995
Y1 - 1995
N2 - Aspheric surface testing would be greatly facilitated if the requirement for a null condition were removed. Testing an optic in a non-null configuration introduces aberrations into the wavefront. The wavefront measured at the sensor is different from the wavefront initially produced by the test surface, and the interferometer must be calibrated if useful measurements of aspheres are to be made. One potential calibration technique is reverse optimization, where a lens design program is used to retrieve the prescription of the interferometer. Various problems in modeling an interferometer, and potential solutions, are discussed. A defocused sphere was used to generate a non-null wavefront with 100λ of departure at the surface. The reverse optimization results matched the experimental data to better than λ/4 PV.
AB - Aspheric surface testing would be greatly facilitated if the requirement for a null condition were removed. Testing an optic in a non-null configuration introduces aberrations into the wavefront. The wavefront measured at the sensor is different from the wavefront initially produced by the test surface, and the interferometer must be calibrated if useful measurements of aspheres are to be made. One potential calibration technique is reverse optimization, where a lens design program is used to retrieve the prescription of the interferometer. Various problems in modeling an interferometer, and potential solutions, are discussed. A defocused sphere was used to generate a non-null wavefront with 100λ of departure at the surface. The reverse optimization results matched the experimental data to better than λ/4 PV.
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M3 - Conference contribution
AN - SCOPUS:0029521796
SN - 0819418951
SN - 9780819418951
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 139
EP - 147
BT - Proceedings of SPIE - The International Society for Optical Engineering
T2 - Optical Manufacturing and Testing
Y2 - 9 July 1995 through 11 July 1995
ER -