Model-based steganalysis using invariant features

Tu Thach Quach, Fernando Pérez-González, Gregory L. Heileman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations


One of the biggest challenges in universal steganalysis is the identification of reliable features that can be used to detect stego images. In this paper, we present a steganalysis method using features calculated from a measure that is invariant for cover images and is altered for stego images. We derive this measure, which is the ratio of any two Fourier coefficients of the distribution of the DCT coefficients, by modeling the distribution of the DCT coefficients as a Laplacian. We evaluate our steganalysis detector against three different pixel-domain steganography techniques.

Original languageEnglish (US)
Title of host publicationMedia Forensics and Security
StatePublished - 2009
Externally publishedYes
EventMedia Forensics and Security - San Jose, CA, United States
Duration: Jan 19 2009Jan 21 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


ConferenceMedia Forensics and Security
Country/TerritoryUnited States
CitySan Jose, CA


  • Information hiding
  • Steganalysis
  • Steganography

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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