MIRI/JWST detector characterization

Stacey N. Bright, M. E. Ressler, Stacey Alberts, Alberto Noriega-Crespo, Jane E. Morrison, Macarena García-Marín, Ori Fox, G. H. Rieke, Alistair C. Glasse, G. S. Wright, Dean C. Hines, P. Bouchet, D. Dicken

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations


We report on tests of the Mid-Infrared Instrument (MIRI) focal plane electronics (FPE) and detectors conducted at the Jet Propulsion Laboratory (JPL). The goals of these tests are to: characterize the performance of readout modes; establish subarray operations; characterize changes to performance when switching between subarrays and/or readout modes; fine tune detector settings to mitigate residual artifacts; optimize anneal effectiveness; and characterize persistence. The tests are part of a continuing effort to support the MIRI pipeline development through better understanding of the detector behavior. An extensive analysis to determine the performance of the readout modes was performed. We report specifically on the comparison of the fast and slow readout modes and subarray tests.

Original languageEnglish (US)
Title of host publicationSpace Telescopes and Instrumentation 2016
Subtitle of host publicationOptical, Infrared, and Millimeter Wave
EditorsHoward A. MacEwen, Makenzie Lystrup, Giovanni G. Fazio
ISBN (Electronic)9781510601871
StatePublished - 2016
EventSpace Telescopes and Instrumentation 2016: Optical, Infrared, and Millimeter Wave - Edinburgh, United Kingdom
Duration: Jun 26 2016Jul 1 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


OtherSpace Telescopes and Instrumentation 2016: Optical, Infrared, and Millimeter Wave
Country/TerritoryUnited Kingdom


  • Detector
  • JWST
  • MIRI

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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