Minimum detectable displacement in near-field scanning optical microscopy

Fred F. Froehlich; Tom D. Milster

doi:10.1063/1.112735

Minimum detectable displacement in near-field scanning optical microscopy

Fred F. Froehlich, Tom D. Milster

Research output: Contribution to journal › Article › peer-review

35 Scopus citations

Abstract

The probe-to-sample separation in near-field scanning optical microscopes can be regulated by a noncontact atomic shear force sensing scheme that allows simultaneous acquisition of optical and shear force images. We have measured the minimum detectable displacement that can be achieved with a scheme based on diffracting a focused laser beam from the vibrating probe. The minimum detectable displacement determines the smallest resolvable change in force acting on the probe. The measured shot-noise-limited value is 2.8×10 ^-3 Å_rms/Hz,and the practical sensitivity is limited by thermal vibration noise to 7×10^-3 Å_rms/Hz. These values compare well with those calculated theoretically.

Original language	English (US)
Pages (from-to)	2254-2256
Number of pages	3
Journal	Applied Physics Letters
Volume	65
Issue number	18
DOIs	https://doi.org/10.1063/1.112735
State	Published - 1994

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.112735

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title = "Minimum detectable displacement in near-field scanning optical microscopy",

abstract = "The probe-to-sample separation in near-field scanning optical microscopes can be regulated by a noncontact atomic shear force sensing scheme that allows simultaneous acquisition of optical and shear force images. We have measured the minimum detectable displacement that can be achieved with a scheme based on diffracting a focused laser beam from the vibrating probe. The minimum detectable displacement determines the smallest resolvable change in force acting on the probe. The measured shot-noise-limited value is 2.8×10 -3 {\AA}rms/Hz,and the practical sensitivity is limited by thermal vibration noise to 7×10-3 {\AA}rms/Hz. These values compare well with those calculated theoretically.",

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year = "1994",

doi = "10.1063/1.112735",

language = "English (US)",

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pages = "2254--2256",

journal = "Applied Physics Letters",

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AU - Milster, Tom D.

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AB - The probe-to-sample separation in near-field scanning optical microscopes can be regulated by a noncontact atomic shear force sensing scheme that allows simultaneous acquisition of optical and shear force images. We have measured the minimum detectable displacement that can be achieved with a scheme based on diffracting a focused laser beam from the vibrating probe. The minimum detectable displacement determines the smallest resolvable change in force acting on the probe. The measured shot-noise-limited value is 2.8×10 -3 Årms/Hz,and the practical sensitivity is limited by thermal vibration noise to 7×10-3 Årms/Hz. These values compare well with those calculated theoretically.

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Minimum detectable displacement in near-field scanning optical microscopy

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