Millimeter wave surface and reflectivity estimation based on sparse time of flight measurements

Ruoyu Zhu; Orges Furxhi; Daniel Marks; David Brady

doi:10.1109/IRMMW-THz.2014.6956301

Millimeter wave surface and reflectivity estimation based on sparse time of flight measurements

Ruoyu Zhu, Orges Furxhi, Daniel Marks, David Brady

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

We present a novel active millimeter wave imaging technique that can be used to estimate target surface and reflectivity. This technique requires no mechanical scanning but requires only a sparse array of detectors. The illumination beam requires no focusing or collimation. The reconstruction is based on the time of flight information from the reflected signal.

Original language	English (US)
Title of host publication	2014 39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2014
Publisher	IEEE Computer Society
ISBN (Electronic)	9781479938773
DOIs	https://doi.org/10.1109/IRMMW-THz.2014.6956301
State	Published - Nov 13 2014
Externally published	Yes
Event	39th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2014 - Tucson, United States Duration: Sep 14 2014 → Sep 19 2014

Publication series

Name	International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
ISSN (Print)	2162-2027
ISSN (Electronic)	2162-2035

Other

Other	39th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2014
Country/Territory	United States
City	Tucson
Period	9/14/14 → 9/19/14

ASJC Scopus subject areas

Energy Engineering and Power Technology
Electrical and Electronic Engineering

Access to Document

10.1109/IRMMW-THz.2014.6956301

Cite this

Zhu, R., Furxhi, O., Marks, D., & Brady, D. (2014). Millimeter wave surface and reflectivity estimation based on sparse time of flight measurements. In 2014 39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2014 Article 6956301 (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz). IEEE Computer Society. https://doi.org/10.1109/IRMMW-THz.2014.6956301

Millimeter wave surface and reflectivity estimation based on sparse time of flight measurements. / Zhu, Ruoyu; Furxhi, Orges; Marks, Daniel et al.
2014 39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2014. IEEE Computer Society, 2014. 6956301 (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Zhu, R, Furxhi, O, Marks, D & Brady, D 2014, Millimeter wave surface and reflectivity estimation based on sparse time of flight measurements. in 2014 39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2014., 6956301, International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz, IEEE Computer Society, 39th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2014, Tucson, United States, 9/14/14. https://doi.org/10.1109/IRMMW-THz.2014.6956301

Zhu R, Furxhi O, Marks D, Brady D. Millimeter wave surface and reflectivity estimation based on sparse time of flight measurements. In 2014 39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2014. IEEE Computer Society. 2014. 6956301. (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz). doi: 10.1109/IRMMW-THz.2014.6956301

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abstract = "We present a novel active millimeter wave imaging technique that can be used to estimate target surface and reflectivity. This technique requires no mechanical scanning but requires only a sparse array of detectors. The illumination beam requires no focusing or collimation. The reconstruction is based on the time of flight information from the reflected signal.",

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AB - We present a novel active millimeter wave imaging technique that can be used to estimate target surface and reflectivity. This technique requires no mechanical scanning but requires only a sparse array of detectors. The illumination beam requires no focusing or collimation. The reconstruction is based on the time of flight information from the reflected signal.

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Millimeter wave surface and reflectivity estimation based on sparse time of flight measurements

Abstract

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