Microwave properties of MAPTMS sol-gel films for high-speed electrooptic devices

V. Demir, R. Voorakaranam, R. Himmelhuber, Oscar D. Herrera, R. A. Norwood, N. Peyghambarian

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


This paper measures the dielectric constant and loss tangent of methacryloyloxy-propyltrimethoxysilane (MAPTMS) sol-gel films over a wide range of microwave frequencies. Samples were prepared by spin-coating sol-gel films onto metallized borosilicate glass substrates. The dielectric properties of the sol-gel were probed up to 50 GHz with several different sets of coplanar waveguide transmission lines electroplated onto sol-gel films. The dielectric constant and loss tangent are determined to be approximately 3.1 and 3 × 10-3 at 35 GHz, respectively. This demonstration shows that MAPTMS sol-gel is a viable material for integration with high-speed electrical and electrooptic devices.

Original languageEnglish (US)
Article number6844904
Pages (from-to)1599-1604
Number of pages6
JournalIEEE Transactions on Microwave Theory and Techniques
Issue number8
StatePublished - Aug 2014


  • Coplanar waveguide (CPW)
  • dielectric material
  • dielectric measurement
  • electrooptic (EO)

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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