Abstract
The ultrafine particles in the sol-gel coatings were evaluated using atomic force microscopy, a direct imaging technique. In addition, correlation of microstructures with processing parameters, coating density and other physical properties are discussed.
| Original language | English (US) |
|---|---|
| Pages | 886-887 |
| Number of pages | 2 |
| State | Published - 1994 |
| Externally published | Yes |
| Event | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994 |
Other
| Other | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America |
|---|---|
| City | New Orleans, LA, USA |
| Period | 7/31/94 → 8/5/94 |
ASJC Scopus subject areas
- General Engineering