Microscopy capabilities of the microscopy, electrochemistry, and conductivity analyzer

M. H. Hecht, J. Marshall, W. T. Pike, U. Staufer, D. Blaney, D. Braendlin, S. Gautsch, W. Goetz, H. R. Hidber, H. U. Keller, W. J. Markiewicz, A. Mazer, T. P. Meloy, J. M. Morookian, C. Mogensen, D. Parrat, P. Smith, H. Sykulska, R. J. Tanner, R. O. ReynoldsA. Tonin, S. Vijendran, M. Weilert, P. M. Woida

Research output: Contribution to journalArticlepeer-review

35 Scopus citations

Abstract

The Phoenix microscopy station, designed for the study of Martian dust and soil, consists of a sample delivery system, an optical microscope, and an atomic force microscope. The combination of microscopies facilitates the study of features from the millimeter to nanometer scale. Light-emitting diode illumination allows for full color optical imaging of the samples as well as imaging of ultraviolet-induced visible fluorescence. The atomic force microscope uses an array of silicon tips and can operate in both static and dynamic mode.

Original languageEnglish (US)
Article numberE00A22
JournalJournal of Geophysical Research: Planets
Volume114
Issue number3
DOIs
StatePublished - Mar 20 2009
Externally publishedYes

ASJC Scopus subject areas

  • Geochemistry and Petrology
  • Geophysics
  • Earth and Planetary Sciences (miscellaneous)
  • Space and Planetary Science

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