Abstract
The capabilities of a fully microscopic approach for the calculation of optical material properties of semiconductor lasers are reviewed. Several comparisons between the results of these calculations and measured data are used to demonstrate that the approach yields excellent quantitative agreement with the experiment. It is outlined how this approach allows one to predict the optical properties of devices under high-power operating conditions based only on low-intensity photo luminescence (PL) spectra. Examples for the gain-, absorption-, PL- and linewidth enhancement factor-spectra in single and multiple quantum-well structures, superlattices, Type II quantum wells and quantum dots, and for various material systems are discussed.
Original language | English (US) |
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Pages (from-to) | 688-697 |
Number of pages | 10 |
Journal | IEEE Journal on Selected Topics in Quantum Electronics |
Volume | 9 |
Issue number | 3 |
DOIs | |
State | Published - May 2003 |
Keywords
- Absorption
- Gain
- Gain measurement
- Modeling
- Photo luminescence (PL)
- Quantum-well lasers
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering