Microdots as a means of marking and tracking artifacts

Dale O. Butterfield, Pamela Vandiver

Research output: Contribution to journalConference articlepeer-review


Scanning electron microscopy with simultaneous energy dispersive x-ray analysis was used to characterize microdots to assess their suitability for the identification and tracking of artifacts. They were found comparable to commercial state-of-the-art microfilm and microfiche which are known to be durable for about 20 years without postprocessing treatment to stabilize them.

Original languageEnglish (US)
Pages (from-to)181-186
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
StatePublished - 1995
EventProceedings of the 1994 Conference on Materials Issues in Art and Archaeology IV - Cancun, Mex
Duration: May 16 1994May 21 1994

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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