Abstract
Scanning electron microscopy with simultaneous energy dispersive x-ray analysis was used to characterize microdots to assess their suitability for the identification and tracking of artifacts. They were found comparable to commercial state-of-the-art microfilm and microfiche which are known to be durable for about 20 years without postprocessing treatment to stabilize them.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 181-186 |
| Number of pages | 6 |
| Journal | Materials Research Society Symposium - Proceedings |
| Volume | 352 |
| State | Published - 1995 |
| Externally published | Yes |
| Event | Proceedings of the 1994 Conference on Materials Issues in Art and Archaeology IV - Cancun, Mex Duration: May 16 1994 → May 21 1994 |
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering