MFM study of NdFeB and NdFeB/Fe/NdFeB thin films

P. C. Gouteff, L. Folks, R. Street

Research output: Contribution to journalArticlepeer-review

8 Scopus citations


Domain structures of NdFeB thin films, ranging in thickness between 1500 and 29 nm, have been studied qualitatively by magnetic force microscopy (MFM). Samples were prepared using a range of sputtering conditions resulting in differences in properties such as texture, coercivity and magnetic saturation. MFM images of all the films showed extensive interaction domain structures, similar to those observed in nanocrystalline bulk NdFeB. An exchange-coupled NdFeB/Fe/NdFeB trilayer with layer thicknesses 18 nm/15 nm/18 nm, respectively, was also examined using MFM.

Original languageEnglish (US)
Pages (from-to)1241-1242
Number of pages2
JournalJournal of Magnetism and Magnetic Materials
Issue numberPART 2
StatePublished - Jan 1998
Externally publishedYes


  • Exchange coupling
  • MFM
  • NdFeB
  • Thin films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


Dive into the research topics of 'MFM study of NdFeB and NdFeB/Fe/NdFeB thin films'. Together they form a unique fingerprint.

Cite this