TY - JOUR
T1 - Method for measuring thermal contact resistance of graphite thin film materials
AU - Li, Xiaogang
AU - Luo, Renxi
AU - Zhang, Weifang
AU - Liao, Haitao
N1 - Funding Information:
Dr. Liao’s work was partially supported by the U.S. National Science Foundation under grant #CMMI 1238301 . The authors would also like to thank the reviewers and editors for providing valuable comments and suggestions that improved the presentation of this paper.
Publisher Copyright:
© 2016 Elsevier Ltd
PY - 2016/11/1
Y1 - 2016/11/1
N2 - Thermal contact resistance (TCR) is an important parameter in thermal analysis of materials. Because of many influential factors, it is difficult to find a general model or computational formula to calculate the TCR of a solid interface. In many engineering applications, TCR values are usually obtained through experiments. Unlike extensive research focusing on ordinary columnar materials, this paper aims at measuring the TCR values of graphite thin film materials. The technical challenge is that it is not convenient to embed thermocouples into such materials. To overcome this challenge, a steady-state method using a copper heat flux meter is developed, which provides a useful tool for indirect TCR measurement. In our experiments, the TCR values of the graphite thin film materials are successfully measured under different temperature and pressure levels. The results provide a valuable guideline for the use of this type of material in high-temperature, high-pressure applications.
AB - Thermal contact resistance (TCR) is an important parameter in thermal analysis of materials. Because of many influential factors, it is difficult to find a general model or computational formula to calculate the TCR of a solid interface. In many engineering applications, TCR values are usually obtained through experiments. Unlike extensive research focusing on ordinary columnar materials, this paper aims at measuring the TCR values of graphite thin film materials. The technical challenge is that it is not convenient to embed thermocouples into such materials. To overcome this challenge, a steady-state method using a copper heat flux meter is developed, which provides a useful tool for indirect TCR measurement. In our experiments, the TCR values of the graphite thin film materials are successfully measured under different temperature and pressure levels. The results provide a valuable guideline for the use of this type of material in high-temperature, high-pressure applications.
KW - Graphite thin film materials
KW - Heat flux
KW - Interface temperature drop
KW - Scanning electron microscope
KW - Thermal contact resistance
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U2 - 10.1016/j.measurement.2016.07.015
DO - 10.1016/j.measurement.2016.07.015
M3 - Article
AN - SCOPUS:84989929370
VL - 93
SP - 202
EP - 207
JO - Measurement: Journal of the International Measurement Confederation
JF - Measurement: Journal of the International Measurement Confederation
SN - 0263-2241
ER -