TY - GEN
T1 - Mechanics of polarization ray tracing
AU - Chipman, Russell A.
PY - 1992
Y1 - 1992
N2 - Polarization ray tracing, which consist of several extensions to geometrical ray tracing, calculates the evolution of polarization states along ray paths and determines the intrinsic polarization properties, such as diattenuation and retardance, associated with ray paths. This paper compares the suitability of the Jones, Mueller, and a three-dimensional polarization ray tracing calculi, examining the issues of local versus global coordinates, amplitude versus phase representations, inclusion of the wavefront aberration function, partially polarized light, measurements of images by polarimeters, and diffraction image formation by low and high numerical aperture beams.
AB - Polarization ray tracing, which consist of several extensions to geometrical ray tracing, calculates the evolution of polarization states along ray paths and determines the intrinsic polarization properties, such as diattenuation and retardance, associated with ray paths. This paper compares the suitability of the Jones, Mueller, and a three-dimensional polarization ray tracing calculi, examining the issues of local versus global coordinates, amplitude versus phase representations, inclusion of the wavefront aberration function, partially polarized light, measurements of images by polarimeters, and diffraction image formation by low and high numerical aperture beams.
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M3 - Conference contribution
AN - SCOPUS:0026971443
SN - 0819409197
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 62
EP - 75
BT - Proceedings of SPIE - The International Society for Optical Engineering
PB - Publ by Int Soc for Optical Engineering
T2 - Polarization Analysis and Measurement
Y2 - 19 July 1992 through 21 July 1992
ER -