@inproceedings{e5d39ab08ace4a07a857018466467a13,
title = "Measuring the elastic modulus of polymers by nanoindentation with an atomic force microscope",
abstract = "A new method to determine the elastic modulus of a material using the atomic force microscope (AFM) has been proposed by Tang et al. (Nanotechnology 2008, 19, 495713). This method models the cantilever and the sample as two springs in a series. The ratio of the cantilever spring constant (k) to diameter of the tip (2a) is treated in the model as one parameter (a=k/2d). The value of a, along with the cantilever sensitivity, are determined on two reference samples with known mechanical properties and then used to find the elastic modulus of an unknown sample. To determine the reliability and accuracy of this technique it was tested on several polymers. Traditional depth-sensing nanoindentation was preformed for comparison. Using both methods, the elastic modulus of the polymers tested was calculated. The elastic modulus values from the AFM were within ±(5-20)% of the nanoindenter results.",
keywords = "Atomic force microscopy, Elastic modulus, Nanoindentation, Polymers",
author = "Daniel Hoffman and Ibrahim Miskioglu and Jaroslaw Drelich and Katerina Aifantis",
year = "2011",
doi = "10.1002/9781118495285.ch30",
language = "English (US)",
isbn = "9781617827389",
series = "TMS Annual Meeting",
publisher = "Minerals, Metals and Materials Society",
pages = "243--251",
booktitle = "EPD Congress 2011 - Held During TMS 2011 Annual Meeting and Exhibition",
note = "EPD Congress 2011 - TMS 2011 Annual Meeting and Exhibition ; Conference date: 27-02-2011 Through 03-03-2011",
}