Measuring degradation rates without irradiance data

Steve Pulver; Daniel Cormode; Alex Cronin; Dirk Jordan; Sarah Kurtz; Ryan Smith

doi:10.1109/PVSC.2010.5614208

Measuring degradation rates without irradiance data

Steve Pulver, Daniel Cormode, Alex Cronin, Dirk Jordan, Sarah Kurtz, Ryan Smith

Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

14 Scopus citations

Abstract

A method to report photovoltaic (PV) system degradation rates without using irradiance data is demonstrated. First, a set of relative degradation rates are determined by comparing daily AC final yields from a group of PV systems relative to the average final yield of all the PV systems. Then, the difference between relative and absolute degradation rates is found using a Bayesian statistical analysis. This approach is verified by comparing to methods that utilize irradiance data. This approach is significant because PV systems are often deployed without irradiance sensors, so the analysis method described here may enable measurements of degradation using data that were previously thought to be unsuitable for degradation studies.

Original language	English (US)
Title of host publication	Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Pages	1271-1276
Number of pages	6
DOIs	https://doi.org/10.1109/PVSC.2010.5614208
State	Published - 2010
Event	35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States Duration: Jun 20 2010 → Jun 25 2010

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Other

Other	35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Country/Territory	United States
City	Honolulu, HI
Period	6/20/10 → 6/25/10

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC.2010.5614208

Cite this

Pulver, S, Cormode, D, Cronin, A, Jordan, D, Kurtz, S & Smith, R 2010, Measuring degradation rates without irradiance data. in Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010., 5614208, Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 1271-1276, 35th IEEE Photovoltaic Specialists Conference, PVSC 2010, Honolulu, HI, United States, 6/20/10. https://doi.org/10.1109/PVSC.2010.5614208

@inproceedings{825e193a1fd54c40ab6b1cec6a51a92d,

title = "Measuring degradation rates without irradiance data",

abstract = "A method to report photovoltaic (PV) system degradation rates without using irradiance data is demonstrated. First, a set of relative degradation rates are determined by comparing daily AC final yields from a group of PV systems relative to the average final yield of all the PV systems. Then, the difference between relative and absolute degradation rates is found using a Bayesian statistical analysis. This approach is verified by comparing to methods that utilize irradiance data. This approach is significant because PV systems are often deployed without irradiance sensors, so the analysis method described here may enable measurements of degradation using data that were previously thought to be unsuitable for degradation studies.",

author = "Steve Pulver and Daniel Cormode and Alex Cronin and Dirk Jordan and Sarah Kurtz and Ryan Smith",

year = "2010",

doi = "10.1109/PVSC.2010.5614208",

language = "English (US)",

isbn = "9781424458912",

series = "Conference Record of the IEEE Photovoltaic Specialists Conference",

pages = "1271--1276",

booktitle = "Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010",

note = "35th IEEE Photovoltaic Specialists Conference, PVSC 2010 ; Conference date: 20-06-2010 Through 25-06-2010",

}

TY - GEN

T1 - Measuring degradation rates without irradiance data

AU - Pulver, Steve

AU - Cormode, Daniel

AU - Cronin, Alex

AU - Jordan, Dirk

AU - Kurtz, Sarah

AU - Smith, Ryan

PY - 2010

Y1 - 2010

N2 - A method to report photovoltaic (PV) system degradation rates without using irradiance data is demonstrated. First, a set of relative degradation rates are determined by comparing daily AC final yields from a group of PV systems relative to the average final yield of all the PV systems. Then, the difference between relative and absolute degradation rates is found using a Bayesian statistical analysis. This approach is verified by comparing to methods that utilize irradiance data. This approach is significant because PV systems are often deployed without irradiance sensors, so the analysis method described here may enable measurements of degradation using data that were previously thought to be unsuitable for degradation studies.

AB - A method to report photovoltaic (PV) system degradation rates without using irradiance data is demonstrated. First, a set of relative degradation rates are determined by comparing daily AC final yields from a group of PV systems relative to the average final yield of all the PV systems. Then, the difference between relative and absolute degradation rates is found using a Bayesian statistical analysis. This approach is verified by comparing to methods that utilize irradiance data. This approach is significant because PV systems are often deployed without irradiance sensors, so the analysis method described here may enable measurements of degradation using data that were previously thought to be unsuitable for degradation studies.

UR - http://www.scopus.com/inward/record.url?scp=78650161524&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=78650161524&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2010.5614208

DO - 10.1109/PVSC.2010.5614208

M3 - Conference contribution

AN - SCOPUS:78650161524

SN - 9781424458912

T3 - Conference Record of the IEEE Photovoltaic Specialists Conference

SP - 1271

EP - 1276

BT - Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010

T2 - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010

Y2 - 20 June 2010 through 25 June 2010

ER -

Measuring degradation rates without irradiance data

Abstract

Publication series

Other

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this