Measurements of Ultrafast Optical Nonlinearities in Semiconductors

B. D. Fluegel; J. P. Sokoloff; F. Jarka; S. W. Koch; M. Lindberg; N. Peyghambarian; M. Joffre; D. Hulin; A. Migus; A. Antonetti; C. Ell; L. Banyai; H. Haug

doi:10.1002/pssb.2221500203

Measurements of Ultrafast Optical Nonlinearities in Semiconductors

B. D. Fluegel, J. P. Sokoloff, F. Jarka, S. W. Koch, M. Lindberg, N. Peyghambarian, M. Joffre, D. Hulin, A. Migus, A. Antonetti, C. Ell, L. Banyai, H. Haug

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18 Scopus citations

Abstract

The response of a bulk semiconductor platelet under the influence of nonresonant pulse excitation below the band gap is measured using femtosecond laser techniques. These optical Stark effect measurements are analyzed using the effective Bloch equations for semiconductors. These equations are solved (i) dynamically in the large detuning, low intensity limit and (ii) for arbitrary intensities in the adiabatic limit.

Original language	English (US)
Pages (from-to)	357-363
Number of pages	7
Journal	physica status solidi (b)
Volume	150
Issue number	2
DOIs	https://doi.org/10.1002/pssb.2221500203
State	Published - Dec 1 1988

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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title = "Measurements of Ultrafast Optical Nonlinearities in Semiconductors",

abstract = "The response of a bulk semiconductor platelet under the influence of nonresonant pulse excitation below the band gap is measured using femtosecond laser techniques. These optical Stark effect measurements are analyzed using the effective Bloch equations for semiconductors. These equations are solved (i) dynamically in the large detuning, low intensity limit and (ii) for arbitrary intensities in the adiabatic limit.",

author = "Fluegel, {B. D.} and Sokoloff, {J. P.} and F. Jarka and Koch, {S. W.} and M. Lindberg and N. Peyghambarian and M. Joffre and D. Hulin and A. Migus and A. Antonetti and C. Ell and L. Banyai and H. Haug",

year = "1988",

month = dec,

day = "1",

doi = "10.1002/pssb.2221500203",

language = "English (US)",

volume = "150",

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TY - JOUR

T1 - Measurements of Ultrafast Optical Nonlinearities in Semiconductors

AU - Fluegel, B. D.

AU - Sokoloff, J. P.

AU - Jarka, F.

AU - Koch, S. W.

AU - Lindberg, M.

AU - Peyghambarian, N.

AU - Joffre, M.

AU - Hulin, D.

AU - Migus, A.

AU - Antonetti, A.

AU - Ell, C.

AU - Banyai, L.

AU - Haug, H.

PY - 1988/12/1

Y1 - 1988/12/1

N2 - The response of a bulk semiconductor platelet under the influence of nonresonant pulse excitation below the band gap is measured using femtosecond laser techniques. These optical Stark effect measurements are analyzed using the effective Bloch equations for semiconductors. These equations are solved (i) dynamically in the large detuning, low intensity limit and (ii) for arbitrary intensities in the adiabatic limit.

AB - The response of a bulk semiconductor platelet under the influence of nonresonant pulse excitation below the band gap is measured using femtosecond laser techniques. These optical Stark effect measurements are analyzed using the effective Bloch equations for semiconductors. These equations are solved (i) dynamically in the large detuning, low intensity limit and (ii) for arbitrary intensities in the adiabatic limit.

UR - http://www.scopus.com/inward/record.url?scp=0024134826&partnerID=8YFLogxK

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U2 - 10.1002/pssb.2221500203

DO - 10.1002/pssb.2221500203

M3 - Article

AN - SCOPUS:0024134826

SN - 0370-1972

VL - 150

SP - 357

EP - 363

JO - physica status solidi (b)

JF - physica status solidi (b)

IS - 2

ER -

Measurements of Ultrafast Optical Nonlinearities in Semiconductors

Abstract

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