Measurements of Ultrafast Optical Nonlinearities in Semiconductors

B. D. Fluegel, J. P. Sokoloff, F. Jarka, S. W. Koch, M. Lindberg, N. Peyghambarian, M. Joffre, D. Hulin, A. Migus, A. Antonetti, C. Ell, L. Banyai, H. Haug

Research output: Contribution to journalArticlepeer-review

18 Scopus citations


The response of a bulk semiconductor platelet under the influence of nonresonant pulse excitation below the band gap is measured using femtosecond laser techniques. These optical Stark effect measurements are analyzed using the effective Bloch equations for semiconductors. These equations are solved (i) dynamically in the large detuning, low intensity limit and (ii) for arbitrary intensities in the adiabatic limit.

Original languageEnglish (US)
Pages (from-to)357-363
Number of pages7
Journalphysica status solidi (b)
Issue number2
StatePublished - Dec 1 1988

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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