Abstract
We describe a method to estimate the thermal conductivity of the substrate, the dielectric layer, the phase-change (PC) layer, and the reflective layer of PC optical recording media. The method relies on the amorphous-to-crystalline phase transition that occurs in the PC layer and takes advantage of the difference in the thermal diffusion behavior under different-sized focused spots. All the results obtained here are reliable with better than 65% accuracy, which is within the margin of our experimental error.
Original language | English (US) |
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Pages (from-to) | 2347-2352 |
Number of pages | 6 |
Journal | Applied optics |
Volume | 39 |
Issue number | 14 |
DOIs | |
State | Published - May 10 2000 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering