Abstract
A new method was developed for determining the thermal coefficients of erasable phase change films. The method consists of monitoring the reflectivity variations of a PC sample during the writing process. The system uses a 1.7 μs laser pulse at a fixed power level to create a hot spot under the focused beam, while simultaneously observing the reflectivity variations. The amount of reflected light does not increase initially after the laser has been turned on; there is a knee in each curve that corresponds to the onset of noticeable reflectivity change. Two single layer PC samples were measured using this technique: one was a 35 nm-thick sample and the other was 90 mm thick, both coated on identical glass substrate.
Original language | English (US) |
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Pages | 96-97 |
Number of pages | 2 |
State | Published - 1997 |
Event | Proceedings of the 1997 Optical Data Storage Topical Meeting, ODS - Tucson, AZ, USA Duration: Apr 7 1997 → Apr 9 1997 |
Other
Other | Proceedings of the 1997 Optical Data Storage Topical Meeting, ODS |
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City | Tucson, AZ, USA |
Period | 4/7/97 → 4/9/97 |
ASJC Scopus subject areas
- General Engineering