Abstract
The amplitude and phase of ultrashort opücal pulses generated by modelocked lasers yield information about the physical mechanisms that shape the pulse inside the laser. The form of the electric field of pulses with a duration of several tens of femtoseconds can only be retrieved through indirect diagnostic techniques, however. A number of protocols for determining the pulse field envelope have been developed in the past several years and, in this paper, we discuss the application of two pulse measurement techniques, including a novel linear mterferometric method, to the measurement of the pulses from a colliding pulse modelocked (CPM) dye laser and a self-modelocked Ti:Sapphire laser.
Original language | English (US) |
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Pages (from-to) | 137-148 |
Number of pages | 12 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 1861 |
DOIs | |
State | Published - Jun 17 1993 |
Event | Ultrafast Pulse Generation and Spectroscopy 1993 - Los Angeles, United States Duration: Jan 17 1993 → Jan 22 1993 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering