Measurement of refractive index and thickness of transparent plate by dual-wavelength interference

Hee Joo Choi, Hwan Hong Lim, Han Seb Moon, Tae Bong Eom, Jung Jin Ju, Myoungsik Cha

Research output: Contribution to journalArticlepeer-review

63 Scopus citations

Abstract

We developed an accurate and efficient method for measuring the refractive indices of a transparent plate by analyzing the transmitted intensity versus angle of incidence. By using two different wavelengths, we resolved the 2π-ambiguity inherent to the phase measurement involving a thick medium, leading to independent determination of the absolute index of refraction and the thickness with a relative uncertainty of 10-5. The validity and the accuracy of our method were confirmed with a standard reference material. Furthermore, our method is insensitive to environmental perturbations, and simple to implement, compared to the conventional index measurement methods providing similar accuracy.

Original languageEnglish (US)
Pages (from-to)9429-9434
Number of pages6
JournalOptics Express
Volume18
Issue number9
DOIs
StatePublished - Apr 26 2010
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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