Measurement of linear coefficient of thermal expansion and temperature-dependent refractive index using interferometric system

James A. Corsetti, William E. Green, Jonathan D. Ellis, Greg R. Schmidt, Duncan T. Moore

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

A system combining an interferometer with an environmental chamber for measuring both coefficient of thermal expansion (CTE) and temperature-dependent refractive index (dn/dT) simultaneously is presented. The operation and measurement results of this instrument are discussed.

Original languageEnglish (US)
Title of host publicationOptical Design and Fabrication, OFT 2017
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781943580316
DOIs
StatePublished - 2017
EventOptical Design and Fabrication, OFT 2017 - Denver, United States
Duration: Jul 9 2017Jul 13 2017

Publication series

NameOptics InfoBase Conference Papers
VolumePart F56-OFT 2017
ISSN (Electronic)2162-2701

Other

OtherOptical Design and Fabrication, OFT 2017
Country/TerritoryUnited States
CityDenver
Period7/9/177/13/17

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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