Measurement of ion-exchanged waveguide burial depth with a camera

Jesse A. Frantz; James T.A. Carriere; Raymond K. Kostuk

doi:10.1117/1.1814364

Measurement of ion-exchanged waveguide burial depth with a camera

Jesse A. Frantz
, James T.A. Carriere
, Raymond K. Kostuk

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

We present a novel method of measuring the depth of a mode for a buried ion-exchanged channel waveguide in glass while simultaneously measuring its near-field mode profile. The method is simple to implement and can be used without removing the sample from a standard waveguide characterization system. Experimental results for surface and buried Ag⁺/Na⁺ exchanged waveguides are presented. It is demonstrated that the depth of a mode can be determined with an uncertainty of ±0.2 μm.

Original language	English (US)
Pages (from-to)	3149-3154
Number of pages	6
Journal	Optical Engineering
Volume	43
Issue number	12
DOIs	https://doi.org/10.1117/1.1814364
State	Published - Dec 2004

Keywords

Buried waveguides
Ion-exchanged waveguides
Mode profiles

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
General Engineering

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10.1117/1.1814364

Cite this

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title = "Measurement of ion-exchanged waveguide burial depth with a camera",

abstract = "We present a novel method of measuring the depth of a mode for a buried ion-exchanged channel waveguide in glass while simultaneously measuring its near-field mode profile. The method is simple to implement and can be used without removing the sample from a standard waveguide characterization system. Experimental results for surface and buried Ag+/Na+ exchanged waveguides are presented. It is demonstrated that the depth of a mode can be determined with an uncertainty of ±0.2 μm.",

keywords = "Buried waveguides, Ion-exchanged waveguides, Mode profiles",

author = "Frantz, \{Jesse A.\} and Carriere, \{James T.A.\} and Kostuk, \{Raymond K.\}",

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pages = "3149--3154",

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T1 - Measurement of ion-exchanged waveguide burial depth with a camera

AU - Frantz, Jesse A.

AU - Carriere, James T.A.

AU - Kostuk, Raymond K.

PY - 2004/12

Y1 - 2004/12

N2 - We present a novel method of measuring the depth of a mode for a buried ion-exchanged channel waveguide in glass while simultaneously measuring its near-field mode profile. The method is simple to implement and can be used without removing the sample from a standard waveguide characterization system. Experimental results for surface and buried Ag+/Na+ exchanged waveguides are presented. It is demonstrated that the depth of a mode can be determined with an uncertainty of ±0.2 μm.

AB - We present a novel method of measuring the depth of a mode for a buried ion-exchanged channel waveguide in glass while simultaneously measuring its near-field mode profile. The method is simple to implement and can be used without removing the sample from a standard waveguide characterization system. Experimental results for surface and buried Ag+/Na+ exchanged waveguides are presented. It is demonstrated that the depth of a mode can be determined with an uncertainty of ±0.2 μm.

KW - Buried waveguides

KW - Ion-exchanged waveguides

KW - Mode profiles

UR - https://www.scopus.com/pages/publications/12844249481

UR - https://www.scopus.com/pages/publications/12844249481#tab=citedBy

U2 - 10.1117/1.1814364

DO - 10.1117/1.1814364

M3 - Article

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EP - 3154

JO - Optical Engineering

JF - Optical Engineering

IS - 12

ER -

Measurement of ion-exchanged waveguide burial depth with a camera

Abstract

Keywords

ASJC Scopus subject areas

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