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Measurement of electro-optic properties of ferroelectric thin films using the ultimate ellipsometer
G. Teowee, C. D. Baertlein, John T. Simpson, Tianji Zhao, M. Mansuripur, E. L. Quackenbush, J. M. Boulton, D. R. Uhlmann
Research output: Contribution to journal › Article › peer-review
3
Scopus
citations