Measurement of birefringence in nonlinear crystals by michelson interferometer

Hee Joo Choi, Byeong Joo Kim, Hwan Hong Lim, Myoungsik Cha

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a method to measure the index of refraction of a wafer-type material accurately by using a modified Michelson interferometer. With this method, the difference between the refractive index of the ordinary-wave and that of the extraordinary-wave in the representative nonlinear crystal, LiNbO3 could be measured with ease.

Original languageEnglish (US)
Title of host publicationConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007
PublisherOptical Society of America
ISBN (Print)1424411742, 9781424411740
StatePublished - 2007
Externally publishedYes
EventConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007 - Seoul, Korea, Republic of
Duration: Aug 26 2007Aug 26 2007

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007
Country/TerritoryKorea, Republic of
CitySeoul
Period8/26/078/26/07

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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