Measurement of birefringence in nonlinear crystals by interferometry

Hee Joo Choi, Byeong Joo Kim, Hwan Hong Lim, Myoungsik Cha

Research output: Chapter in Book/Report/Conference proceedingConference contribution


We present a method to estimate birefringence of wafer-type materials by using Michelson interferometry. The difference between the ordinary and extraordinary refractive indices of a LiNbO3 wafer was determined to an accuracy of 10-3.

Original languageEnglish (US)
Title of host publicationLaser Science, LS 2007
PublisherOptical Society of America (OSA)
ISBN (Print)1557528462, 9781557528469
StatePublished - 2007
Externally publishedYes
EventLaser Science, LS 2007 - San Jose, CA, United States
Duration: Sep 16 2007Sep 16 2007

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701


OtherLaser Science, LS 2007
Country/TerritoryUnited States
CitySan Jose, CA

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics


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