TY - GEN
T1 - Maximum-likelihood calibration of an x-ray computed tomography system
AU - Moore, Jared W.
AU - Van Holen, Roel
AU - Barrett, Harrison H.
AU - Furenlid, Lars R.
PY - 2010
Y1 - 2010
N2 - We present a maximum-likelihood (ML) method for calibrating the geometrical parameters of an x-ray computed tomography (CT) system. This method makes use of the full image data and not a reduced set of data. This algorithm is particularly useful for CT systems that change their geometry during the CT acquisition, such as an adaptive CT scan. Our ML search method uses a contracting-grid algorithm that does not require initial starting values to perform its estimate, thus avoiding problems associated with choosing initialization values.
AB - We present a maximum-likelihood (ML) method for calibrating the geometrical parameters of an x-ray computed tomography (CT) system. This method makes use of the full image data and not a reduced set of data. This algorithm is particularly useful for CT systems that change their geometry during the CT acquisition, such as an adaptive CT scan. Our ML search method uses a contracting-grid algorithm that does not require initial starting values to perform its estimate, thus avoiding problems associated with choosing initialization values.
UR - http://www.scopus.com/inward/record.url?scp=79960297251&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79960297251&partnerID=8YFLogxK
U2 - 10.1109/NSSMIC.2010.5874262
DO - 10.1109/NSSMIC.2010.5874262
M3 - Conference contribution
AN - SCOPUS:79960297251
SN - 9781424491063
T3 - IEEE Nuclear Science Symposium Conference Record
SP - 2614
EP - 2616
BT - IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
T2 - 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
Y2 - 30 October 2010 through 6 November 2010
ER -