Manufacturing High-Q Silicon Nitride Photonic Chips via Silicon Hardmask Etching

Shuai Liu, Yuheng Zhang, Zheshen Zhang

Research output: Contribution to conferencePaperpeer-review

Abstract

We present a robust process for fabricating high-Q, dispersion-engineered Si3N4 photonic chips using amorphous silicon hardmask etching with PECVD SiO2 cladding, achieving an intrinsic quality factor up to ∼ 17.5×106 and an average intrinsic quality factor of ∼ 13×106. We anticipate a further reduction in propagation loss through LPCVD SiO2 cladding.

Original languageEnglish (US)
StatePublished - 2024
Externally publishedYes
EventCLEO: Science and Innovations in CLEO 2024, CLEO: S and I 2024 - Part of Conference on Lasers and Electro-Optics - Charlotte, United States
Duration: May 5 2024May 10 2024

Conference

ConferenceCLEO: Science and Innovations in CLEO 2024, CLEO: S and I 2024 - Part of Conference on Lasers and Electro-Optics
Country/TerritoryUnited States
CityCharlotte
Period5/5/245/10/24

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • General Computer Science
  • Space and Planetary Science
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Instrumentation

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