Mach-Zehnder interferometry method for decoupling electro-optic and piezoelectric effects in poled polymer films

Charles Greenlee; Anael Guilmo; Ayodeji Opadeyi; Roland Himmelhuber; Robert A. Norwood; Mahmoud Fallahi; Jingdong Luo; Su Huang; Xing Hua Zhou; Alex K.Y. Jen; Nasser Peyghambarian

doi:10.1063/1.3467847

Mach-Zehnder interferometry method for decoupling electro-optic and piezoelectric effects in poled polymer films

Charles Greenlee
, Anael Guilmo
, Ayodeji Opadeyi
, Roland Himmelhuber
, Robert A. Norwood
, Mahmoud Fallahi
, Jingdong Luo
, Su Huang
, Xing Hua Zhou
, Alex K.Y. Jen
, Nasser Peyghambarian

Research output: Contribution to journal › Article › peer-review

32 Scopus citations

Abstract

A Mach-Zehnder interferometer (MZI) is utilized to decouple the electro-optic and piezoelectric tensor effects occurring in a poled polymer film. This method has significant advantages over the commonly used Teng-Man reflection ellipsometry technique by allowing for the independent determination of the Pockel's coefficients r₁₃ and r₃₃ and the piezoelectric coefficient d₃₃. The r₃₃ value of a guest host polymer that consists of AJLZ53 amorphous polycarbonate was found to be 122.69 pm/V and 123.03 pm/V using the MZI and reflection ellipsometry method, respectively. The r₃₃ data fits well to the dispersion of the second order susceptibility tensor based on the two-level model approximation.

Original language	English (US)
Article number	041109
Journal	Applied Physics Letters
Volume	97
Issue number	4
DOIs	https://doi.org/10.1063/1.3467847
State	Published - Jul 26 2010

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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@article{6c3867db54d5464da4e60bfd984a4a46,

title = "Mach-Zehnder interferometry method for decoupling electro-optic and piezoelectric effects in poled polymer films",

abstract = "A Mach-Zehnder interferometer (MZI) is utilized to decouple the electro-optic and piezoelectric tensor effects occurring in a poled polymer film. This method has significant advantages over the commonly used Teng-Man reflection ellipsometry technique by allowing for the independent determination of the Pockel's coefficients r13 and r33 and the piezoelectric coefficient d33. The r33 value of a guest host polymer that consists of AJLZ53 amorphous polycarbonate was found to be 122.69 pm/V and 123.03 pm/V using the MZI and reflection ellipsometry method, respectively. The r33 data fits well to the dispersion of the second order susceptibility tensor based on the two-level model approximation.",

author = "Charles Greenlee and Anael Guilmo and Ayodeji Opadeyi and Roland Himmelhuber and Norwood, \{Robert A.\} and Mahmoud Fallahi and Jingdong Luo and Su Huang and Zhou, \{Xing Hua\} and Jen, \{Alex K.Y.\} and Nasser Peyghambarian",

note = "Funding Information: The authors would like to acknowledge support from the National Science Foundation through STC-MDITR Program No. DMR 0120967 and ERC-CIAN Program No. EEC-0812072 and the State of Arizona TRIF Photonics Foundation. The authors would like to thank Rika Yatchak from the University of California, San Diego and Amy Van Newkirk from Grove City College for their involvement while participating in the HoP REU program during the summers of 2008 and 2009. We would also like to thank Metricon Corporation for performing refractive index measurements on our test sample and Christopher DeRose of Sandia National Laboratories for helpful discussions. ",

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doi = "10.1063/1.3467847",

language = "English (US)",

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T1 - Mach-Zehnder interferometry method for decoupling electro-optic and piezoelectric effects in poled polymer films

AU - Greenlee, Charles

AU - Guilmo, Anael

AU - Opadeyi, Ayodeji

AU - Himmelhuber, Roland

AU - Norwood, Robert A.

AU - Fallahi, Mahmoud

AU - Luo, Jingdong

AU - Huang, Su

AU - Zhou, Xing Hua

AU - Jen, Alex K.Y.

AU - Peyghambarian, Nasser

N1 - Funding Information: The authors would like to acknowledge support from the National Science Foundation through STC-MDITR Program No. DMR 0120967 and ERC-CIAN Program No. EEC-0812072 and the State of Arizona TRIF Photonics Foundation. The authors would like to thank Rika Yatchak from the University of California, San Diego and Amy Van Newkirk from Grove City College for their involvement while participating in the HoP REU program during the summers of 2008 and 2009. We would also like to thank Metricon Corporation for performing refractive index measurements on our test sample and Christopher DeRose of Sandia National Laboratories for helpful discussions.

PY - 2010/7/26

Y1 - 2010/7/26

N2 - A Mach-Zehnder interferometer (MZI) is utilized to decouple the electro-optic and piezoelectric tensor effects occurring in a poled polymer film. This method has significant advantages over the commonly used Teng-Man reflection ellipsometry technique by allowing for the independent determination of the Pockel's coefficients r13 and r33 and the piezoelectric coefficient d33. The r33 value of a guest host polymer that consists of AJLZ53 amorphous polycarbonate was found to be 122.69 pm/V and 123.03 pm/V using the MZI and reflection ellipsometry method, respectively. The r33 data fits well to the dispersion of the second order susceptibility tensor based on the two-level model approximation.

AB - A Mach-Zehnder interferometer (MZI) is utilized to decouple the electro-optic and piezoelectric tensor effects occurring in a poled polymer film. This method has significant advantages over the commonly used Teng-Man reflection ellipsometry technique by allowing for the independent determination of the Pockel's coefficients r13 and r33 and the piezoelectric coefficient d33. The r33 value of a guest host polymer that consists of AJLZ53 amorphous polycarbonate was found to be 122.69 pm/V and 123.03 pm/V using the MZI and reflection ellipsometry method, respectively. The r33 data fits well to the dispersion of the second order susceptibility tensor based on the two-level model approximation.

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Mach-Zehnder interferometry method for decoupling electro-optic and piezoelectric effects in poled polymer films

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