@article{6c3867db54d5464da4e60bfd984a4a46,
title = "Mach-Zehnder interferometry method for decoupling electro-optic and piezoelectric effects in poled polymer films",
abstract = "A Mach-Zehnder interferometer (MZI) is utilized to decouple the electro-optic and piezoelectric tensor effects occurring in a poled polymer film. This method has significant advantages over the commonly used Teng-Man reflection ellipsometry technique by allowing for the independent determination of the Pockel's coefficients r13 and r33 and the piezoelectric coefficient d33. The r33 value of a guest host polymer that consists of AJLZ53 amorphous polycarbonate was found to be 122.69 pm/V and 123.03 pm/V using the MZI and reflection ellipsometry method, respectively. The r33 data fits well to the dispersion of the second order susceptibility tensor based on the two-level model approximation.",
author = "Charles Greenlee and Anael Guilmo and Ayodeji Opadeyi and Roland Himmelhuber and Norwood, {Robert A.} and Mahmoud Fallahi and Jingdong Luo and Su Huang and Zhou, {Xing Hua} and Jen, {Alex K.Y.} and Nasser Peyghambarian",
note = "Funding Information: The authors would like to acknowledge support from the National Science Foundation through STC-MDITR Program No. DMR 0120967 and ERC-CIAN Program No. EEC-0812072 and the State of Arizona TRIF Photonics Foundation. The authors would like to thank Rika Yatchak from the University of California, San Diego and Amy Van Newkirk from Grove City College for their involvement while participating in the HoP REU program during the summers of 2008 and 2009. We would also like to thank Metricon Corporation for performing refractive index measurements on our test sample and Christopher DeRose of Sandia National Laboratories for helpful discussions. ",
year = "2010",
month = jul,
day = "26",
doi = "10.1063/1.3467847",
language = "English (US)",
volume = "97",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics",
number = "4",
}