TY - JOUR
T1 - Longitudinal patent analysis for nanoscale science and engineering
T2 - Country, institution and technology field
AU - Huang, Zan
AU - Chen, Hsinchun
AU - Yip, Alan
AU - Ng, Gavin
AU - Guo, Fei
AU - Chen, Zhi Kai
AU - Roco, Mihail C.
N1 - Funding Information:
This research is supported by the grant: NSF, ‘SGER: NanoPort: Intelligent Web Searching for Nanoscale Science and Engineering’, CTS-0204375 January 2002 to December 2002. The last co-author was supported by the NSF Directorate for Engineering.
PY - 2003/8
Y1 - 2003/8
N2 - Nanoscale science and engineering (NSE) and related areas have seen rapid growth in recent years. The speed and scope of development in the field have made it essential for researchers to be informed on the progress across different laboratories, companies, industries and countries. In this project, we experimented with several analysis and visualization techniques on NSE-related United States patent documents to support various knowledge tasks. This paper presents results on the basic analysis of nanotechnology patents between 1976 and 2002, content map analysis and citation network analysis. The data have been obtained on individual countries, institutions and technology fields. The top 10 countries with the largest number of nanotechnology patents are the United States, Japan, France, the United Kingdom, Taiwan, Korea, the Netherlands, Switzerland, Italy and Australia. The fastest growth in the last 5 years has been in chemical and pharmaceutical fields, followed by semiconductor devices. The results demonstrate potential of information-based discovery and visualization technologies to capture knowledge regarding nanotechnology performance, transfer of knowledge and trends of development through analyzing the patent documents.
AB - Nanoscale science and engineering (NSE) and related areas have seen rapid growth in recent years. The speed and scope of development in the field have made it essential for researchers to be informed on the progress across different laboratories, companies, industries and countries. In this project, we experimented with several analysis and visualization techniques on NSE-related United States patent documents to support various knowledge tasks. This paper presents results on the basic analysis of nanotechnology patents between 1976 and 2002, content map analysis and citation network analysis. The data have been obtained on individual countries, institutions and technology fields. The top 10 countries with the largest number of nanotechnology patents are the United States, Japan, France, the United Kingdom, Taiwan, Korea, the Netherlands, Switzerland, Italy and Australia. The fastest growth in the last 5 years has been in chemical and pharmaceutical fields, followed by semiconductor devices. The results demonstrate potential of information-based discovery and visualization technologies to capture knowledge regarding nanotechnology performance, transfer of knowledge and trends of development through analyzing the patent documents.
KW - Citation networks
KW - Information visualization
KW - Knowledge discovery
KW - Nanoscience
KW - Nanotechnology
KW - Patent analysis
KW - Self-organizing map
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UR - http://www.scopus.com/inward/citedby.url?scp=0042377240&partnerID=8YFLogxK
U2 - 10.1023/A:1025556800994
DO - 10.1023/A:1025556800994
M3 - Article
AN - SCOPUS:0042377240
SN - 1388-0764
VL - 5
SP - 333
EP - 363
JO - Journal of Nanoparticle Research
JF - Journal of Nanoparticle Research
IS - 3-4
ER -