Linewidth broadening factor of a microcavity semiconductor laser

R. Jin, D. Boggavarapu, G. Khitrova, H. M. Gibbs, Y. Z. Hu, S. W. Koch, N. Peyghambarian

Research output: Contribution to journalArticlepeer-review

26 Scopus citations


The emission linewidth above threshold is measured in a GaAs/AlGaAs microcavity surface-emitting laser with a single cavity mode. The measured linewidth broadening factor is in good agreement with theoretical calculations that include the most important many-body Coulomb effects of the electron-hole plasma.

Original languageEnglish (US)
Pages (from-to)1883-1885
Number of pages3
JournalApplied Physics Letters
Issue number16
StatePublished - 1992

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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