Linearly polarized emission of an organic semiconductor nanobelt

Aniket Datar; Kaushik Balakrishnan; Xiaomei Yang; Xiaobing Zuo; Jialing Huang; Randy Oitker; Max Yen; Jincai Zhao; David M. Tiede; Ling Zang

doi:10.1021/jp061739j

Linearly polarized emission of an organic semiconductor nanobelt

Aniket Datar, Kaushik Balakrishnan, Xiaomei Yang, Xiaobing Zuo, Jialing Huang, Randy Oitker, Max Yen, Jincai Zhao, David M. Tiede, Ling Zang

Optical Sciences, College of

Research output: Contribution to journal › Article › peer-review

87 Scopus citations

Abstract

Linearly polarized emission has been observed for the nanobelts fabricated from a perylene diimide molecule through both solution-based and surface-supported self-assembling. The measurement of polarized emission was performed over single nanobelts with use of a near-field scanning optical microscope (NSOM) adapted with emission polarization (by putting a planar polarizer before the detector). Rotating the emission polarizer (from 0° to 180°) changed the emission intensity in a way depending on the relative angle between the long axis of the belt and the polarizer with a minimum of intensity detected at ca. 78°, which is indicative of the tilted stacking of molecules along the belt direction.

Original language	English (US)
Pages (from-to)	12327-12332
Number of pages	6
Journal	Journal of Physical Chemistry B
Volume	110
Issue number	25
DOIs	https://doi.org/10.1021/jp061739j
State	Published - Jun 29 2006

ASJC Scopus subject areas

Physical and Theoretical Chemistry
Surfaces, Coatings and Films
Materials Chemistry

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10.1021/jp061739j

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title = "Linearly polarized emission of an organic semiconductor nanobelt",

abstract = "Linearly polarized emission has been observed for the nanobelts fabricated from a perylene diimide molecule through both solution-based and surface-supported self-assembling. The measurement of polarized emission was performed over single nanobelts with use of a near-field scanning optical microscope (NSOM) adapted with emission polarization (by putting a planar polarizer before the detector). Rotating the emission polarizer (from 0° to 180°) changed the emission intensity in a way depending on the relative angle between the long axis of the belt and the polarizer with a minimum of intensity detected at ca. 78°, which is indicative of the tilted stacking of molecules along the belt direction.",

author = "Aniket Datar and Kaushik Balakrishnan and Xiaomei Yang and Xiaobing Zuo and Jialing Huang and Randy Oitker and Max Yen and Jincai Zhao and Tiede, {David M.} and Ling Zang",

year = "2006",

month = jun,

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doi = "10.1021/jp061739j",

language = "English (US)",

volume = "110",

pages = "12327--12332",

journal = "Journal of Physical Chemistry B",

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T1 - Linearly polarized emission of an organic semiconductor nanobelt

AU - Datar, Aniket

AU - Balakrishnan, Kaushik

AU - Yang, Xiaomei

AU - Zuo, Xiaobing

AU - Huang, Jialing

AU - Oitker, Randy

AU - Yen, Max

AU - Zhao, Jincai

AU - Tiede, David M.

AU - Zang, Ling

PY - 2006/6/29

Y1 - 2006/6/29

N2 - Linearly polarized emission has been observed for the nanobelts fabricated from a perylene diimide molecule through both solution-based and surface-supported self-assembling. The measurement of polarized emission was performed over single nanobelts with use of a near-field scanning optical microscope (NSOM) adapted with emission polarization (by putting a planar polarizer before the detector). Rotating the emission polarizer (from 0° to 180°) changed the emission intensity in a way depending on the relative angle between the long axis of the belt and the polarizer with a minimum of intensity detected at ca. 78°, which is indicative of the tilted stacking of molecules along the belt direction.

AB - Linearly polarized emission has been observed for the nanobelts fabricated from a perylene diimide molecule through both solution-based and surface-supported self-assembling. The measurement of polarized emission was performed over single nanobelts with use of a near-field scanning optical microscope (NSOM) adapted with emission polarization (by putting a planar polarizer before the detector). Rotating the emission polarizer (from 0° to 180°) changed the emission intensity in a way depending on the relative angle between the long axis of the belt and the polarizer with a minimum of intensity detected at ca. 78°, which is indicative of the tilted stacking of molecules along the belt direction.

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JO - Journal of Physical Chemistry B

JF - Journal of Physical Chemistry B

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Linearly polarized emission of an organic semiconductor nanobelt

Abstract

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